X-EYE SF160 SERIES
2D&3D MICRO CT SYSEM

⭐ 1. Ultra-High Resolution Micro-Focus X-ray Inspection
Equipped with a 160kV micro-focus X-ray tube, the system can detect extremely fine defects down to around 1 µm, ensuring precise inspection of hidden micro-scale issues in PCBs and semiconductor packages.

⚡ 2. Advanced 2D & 3D CT Analysis with Oblique CT Technology
Supports both 2D and 3D CT scanning, including unique oblique CT technology that enables high-magnification imaging of large and flat components while accurately identifying defect location and size.

🔧 3. Non-Destructive Inspection with Wide Application Coverage
Provides non-destructive testing for SMT, PCB, semiconductor, and electronic components, allowing internal defect analysis (voids, cracks, misalignment) without damaging the product.